The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Jun. 25, 2012
Applicants:

Hisanari Torii, Aichi, JP;

Yukihiro Higuchi, Aichi, JP;

Norimasa Satake, Aichi, JP;

Inventors:

Hisanari Torii, Aichi, JP;

Yukihiro Higuchi, Aichi, JP;

Norimasa Satake, Aichi, JP;

Assignee:

NIDEK CO., LTD., Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0025 (2013.01);
Abstract

A method for monitoring an image of an examinee's eye includes: obtaining first image data including a first examinee's eye image captured by a first ophthalmologic photographing apparatus, and additional information including type information on the first examinee's eye image; obtaining second image data including a second examinee's eye image captured by a second ophthalmologic photographing apparatus different from the first ophthalmologic photographing apparatus, and additional information including type information on the second examinee's eye image; recognizing the first examinee's eye image and the second examinee's eye image as the same type of images, based on the additional information; and correcting a difference between the first examinee's eye image and the second examinee's eye image.


Find Patent Forward Citations

Loading…