The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

Feb. 10, 2014
Applicant:

David Wagner, Broomfield, CO (US);

Inventor:

David Wagner, Broomfield, CO (US);

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 15/00 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00127 (2013.01); H04N 1/00957 (2013.01);
Abstract

Systems and methods are provided for utilizing stacks to identify Advanced Function Presentation (AFP) objects. The system includes a memory and a controller. The memory is able to store AFP print data. The controller is able to perform a parsing process on the AFP print data to identify AFP objects. During the parsing process the controller is able to: (A) advance a parsing location within the AFP print data, and (B) if the parsing location corresponds with a BEGIN field for an AFP object, then push an entry representing the AFP object onto a stack. During the parsing process, the controller is further able to (C) determine whether the stack matches a pattern of entries defined by a rule, (D) if the stack matches the pattern, then process the AFP object at the parsing location to perform an action defined in the rule, and (E) repeat operations (A)-(D).


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