The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

Jun. 30, 2014
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventor:

Richard Chiles, Castro Valley, CA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 12/14 (2006.01); G06F 12/16 (2006.01); G08B 23/00 (2006.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01);
Abstract

Improved techniques involve flagging anomalous behavior in a current session when there is sufficient difference between an observed distribution of Markov events in the current session and an observed distribution of Markov events in a global session. Here, 'Markov events' refer to events such as web page transitions and web page addresses. During a user session, a testing server generates a frequency distribution of a set of Markov events of the user session. The testing server also obtains a frequency distribution of previously observed Markov events of a global session, i.e., sets of sessions of previous user sessions or training sessions. The testing server then computes an anomaly statistic depending on the Markov events that indicates a difference between the user session and the global session. The testing server may produce an alert if the anomaly statistic differs significantly from some nominal value.


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