The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

Mar. 19, 2014
Applicant:

Amazon Technologies, Inc., Reno, NV (US);

Inventor:

Dominique Imjya Brezinski, Henderson, NV (US);

Assignee:

Amazon Technologies, Inc., Reno, NV (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 21/00 (2013.01);
U.S. Cl.
CPC ...
H04L 63/14 (2013.01); G06F 21/00 (2013.01);
Abstract

Techniques are described for graph-based analysis of event data in a computing environment. Event data is collected from host devices, the event data describing events in which devices, processes, or services are accessed in the environment. The event data is arranged into a graph that includes vertices corresponding to devices, processes, or services, and edges that connect pairs of vertices. Each edge may identify an event by connecting two vertices corresponding to two devices, processes, or services included in the event. A rarity metric is determined for each edge, indicating a rarity of events of a particular type connecting two vertices. A risk metric may also be determined for each edge, indicating a security risk associated with the event type or the target of the event. The graph may be traversed according to the risk and rarity metrics, to identify patterns of anomalous activity in the event data.


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