The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

Mar. 31, 2014
Applicant:

Marvell International Ltd., Hamilton, BM;

Inventors:

Yakun Sun, Sunnyvale, CA (US);

Zheng Zhang, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 7/02 (2006.01); H04L 1/02 (2006.01); H04L 1/00 (2006.01);
U.S. Cl.
CPC ...
H04L 1/0048 (2013.01); H04L 1/0054 (2013.01); H04L 1/0055 (2013.01);
Abstract

Systems and methods for detecting data in a received signal are provided. A signal that represents a set of data symbols is received. Possible bit values for a single data symbol of the set of data symbols are determined based on the received signal. Possible bit values for other data symbols of the set of data symbols are determined based on the possible bit values for the single data symbol. The determining of the possible bit values for the other data symbols includes determining a first value for each bit included in the other data symbols. The first value is determined by combining i) a first soft metric indicating a likelihood of a state of the bit given the received signal, and ii) a second soft metric representing an a priori probability (APP) for the bit. The first soft metric is not based on the APP for the bit.


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