The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2015
Filed:
Oct. 31, 2012
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Bae-hyung Kim, Yongin-si, KR;
Kyung-il Cho, Seoul, KR;
Dong-wook Kim, Seoul, KR;
Jong-keun Song, Yongin-si, KR;
Seung-heun Lee, Seoul, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); H04B 1/06 (2006.01); G01S 7/52 (2006.01); G10K 11/34 (2006.01); A61B 8/08 (2006.01); G01S 15/89 (2006.01);
U.S. Cl.
CPC ...
H04B 1/06 (2013.01); A61B 8/483 (2013.01); A61B 8/5207 (2013.01); G01S 7/52034 (2013.01); G01S 15/8915 (2013.01); G10K 11/341 (2013.01); A61B 8/4488 (2013.01); G01S 15/8927 (2013.01); G01S 15/8979 (2013.01); G01S 15/8993 (2013.01);
Abstract
A sampling method for generating a diagnostic image of an object is provided. The sampling method may include receiving an echo signal reflected from an object; sampling the received echo signal by using a sampling frequency and storing the I component data and the Q component data extracted according to a result of the sampling.