The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2015
Filed:
Nov. 12, 2012
Applicant:
Freescale Semiconductor, Inc., Austin, TX (US);
Assignee:
FREESCALE SEMICONDUCTOR, INC., Austin, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); H03M 13/05 (2006.01); G11C 29/50 (2006.01); G11C 29/52 (2006.01); G11C 13/00 (2006.01); G06F 11/10 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
H03M 13/05 (2013.01); G06F 11/1068 (2013.01); G11C 13/0002 (2013.01); G11C 13/0064 (2013.01); G11C 13/0069 (2013.01); G11C 29/50008 (2013.01); G11C 29/52 (2013.01); G11C 2029/0409 (2013.01); G11C 2029/0411 (2013.01);
Abstract
A method of programming a non-volatile semiconductor memory device includes determining a number of bit cells that failed to program verify during a program operation. The bit cells are included in a subset of bit cells in an array of bit cells. The method further determines whether an Error Correction Code (ECC) correction has been previously performed for the subset of bit cells. The program operation is considered successful if the number of bit cells that failed to program verify after a predetermined number of program pulses is below a threshold number and the ECC correction has not been performed for the subset of bit cells.