The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

Jul. 12, 2012
Applicant:

Akihiko Tamura, Matsumoto, JP;

Inventor:

Akihiko Tamura, Matsumoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/31 (2006.01); G09G 3/00 (2006.01); G09G 5/00 (2006.01); H04N 21/431 (2011.01); H04N 21/485 (2011.01);
U.S. Cl.
CPC ...
G09G 3/002 (2013.01); G09G 5/00 (2013.01); H04N 9/3185 (2013.01); G09G 2320/0693 (2013.01); G09G 2320/08 (2013.01); H04N 9/3194 (2013.01); H04N 9/3197 (2013.01); H04N 21/431 (2013.01); H04N 21/485 (2013.01);
Abstract

A projector includes a deformation ratio calculating unit that calculates a first deformation ratio on a reference point set in a first image when performing a correction process with respect to a first image data, a deformation ratio determination unit that determines a second deformation ratio of the first image based on the first deformation ratio calculated by the deformation ratio calculation unit, a synthesis image generation unit that generates synthesis image data indicating a synthesis image which is generated by synthesizing a second image indicated by second image data and the first image with a size changed based on the second deformation ratio, a correction unit that performs a correction process with respect to the synthesis image data, and a projection unit that projects the synthesis image based on the synthesis image data which is subjected to the correction process.


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