The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

May. 08, 2012
Applicants:

Dirk Degrell, Speyer, DE;

Thomas Schneider, Heidelberg, DE;

Jutta Erlewein, Karlsruhe, DE;

Inventors:

Dirk Degrell, Speyer, DE;

Thomas Schneider, Heidelberg, DE;

Jutta Erlewein, Karlsruhe, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01);
U.S. Cl.
CPC ...
G06T 11/206 (2013.01);
Abstract

Analytical functions to be applied to business intelligence data may be sequentially selected from a set of chips, each corresponding to a different function. A function associated with a selected chip may be applied to the business intelligence data and the selected chip may be added to an analysis path with other selected chips in a sequential order of selection. A result, which may include at least two selectable data points, may be displayed. Once a data point selection is made, the selection may be used to limit the functions associated with subsequently displayed chips to the selected data points. The chips listed in the analysis path may be used to change prior data point selections, the changes of which may be automatically propagated to any subsequently selected chips as indicated in the analysis path.


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