The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2015
Filed:
Jan. 06, 2012
Heather L. Winkle, Cupertino, CA (US);
Toufic Milan, Ottawa, CA;
Ryan Chen, Sunnyvale, CA (US);
Andrew Phan, Ottawa, CA;
Nikita Pisliakov, Ottawa, CA;
Duc Vuong, Ontario, CA;
Ashok Srinivasan, Ottawa, CA;
Heather L. Winkle, Cupertino, CA (US);
Toufic Milan, Ottawa, CA;
Ryan Chen, Sunnyvale, CA (US);
Andrew Phan, Ottawa, CA;
Nikita Pisliakov, Ottawa, CA;
Duc Vuong, Ontario, CA;
Ashok Srinivasan, Ottawa, CA;
Apple Inc., Cupertino, CA (US);
Abstract
Methods, program products, and systems for analytical charting are described. A system implementing analytical charting techniques can receive a selection input from a data view displaying data retrieved from a database table. The system can determine a context of the selection input, a data environment in which the selection input is received, and characteristics of data being selected. Based on the context, the data environment, and the characteristics, the system can generate a chart data grouping that specifies a relationship between data in a chart. The system can automatically specify one or more data series for the chart based on the chart data grouping. The system can generate chart parameters automatically and transparently to the user. The system can provide the system-generated chart parameters for display and allow user modification to the system-generated chart parameters. The system can then generate a chart using the chart parameters.