The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

Nov. 21, 2012
Applicants:

Keio University, Tokyo, JP;

Nec Corporation, Tokyo, JP;

Inventors:

Michiie Sakamoto, Tokyo, JP;

Akinori Hashiguchi, Tokyo, JP;

Tokiya Abe, Tokyo, JP;

Akira Saito, Tokyo, JP;

Maki Sano, Tokyo, JP;

Assignees:

KEIO UNIVERSITY, Tokyo, JP;

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01);
Abstract

A pathological diagnosis assisting apparatus according to the present invention includes an image classification unit configured to classify at least one type of a specific substance, a tissue area extraction unit configured to extract a tissue area in the image of the sample, an image dividing unit configured to divide the tissue area into a plurality of sections, a specific substance occupancy rate calculation unit configured to, calculate an occupancy rate of the at least one type of the specific substance in each of the plurality of sections, and a diagnosis assisting information providing unit configured to determine an intermediate value of the occupancy rate of the specific substance from the calculated occupancy rates of the plurality of sections and to provide the intermediate value as the diagnosis assisting information.


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