The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2015
Filed:
Nov. 12, 2013
Xerox Corporation, Norwalk, CT (US);
Christopher Jensen, Rochester, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
A system and method are provided for employing a unique optical roll scanning technique, scheme or process for detecting and identifying periodic surface defects associated with rolls usable in image production devices. An apparatus is provided for mounting the roll to implement an inspection technique that facilitates forming an image of a surface of the roll by rotating the roll through an entire cycle above a full width scanner device. The formed image of the surface of the scanned roll is filtered and analyzed particularly by applying a Fourier analysis technique, and/or by subjecting the filtered image data to a series of fast Fourier transforms (FFTs), potentially including 2D FFTs. The analysis process allows detected periodic defects in the formed image of the surface of the roll under analysis to be characterized by a magnitude of a response in a spatial frequency domain.