The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

Dec. 24, 2012
Applicant:

Korea Institute of Science and Technology Information, Daejeon, KR;

Inventors:

Young Ho Moon, Seoul, KR;

Kang Hoe Kim, Seoul, KR;

Seon Ho Kim, Seoul, KR;

Woon Dong Yeo, Seoul, KR;

Jae Woo Kang, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06N 5/02 (2006.01); G06K 9/62 (2006.01); G06N 99/00 (2010.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06N 5/02 (2013.01); G06F 17/30014 (2013.01); G06K 9/6269 (2013.01); G06N 3/08 (2013.01); G06N 99/005 (2013.01);
Abstract

A method of evaluating a value of reference information and an apparatus for evaluating a value of reference information are disclosed. According to an embodiment of the present invention, the method includes calculating similarity values of reference relationships between the subject document and each of neighbor documents, respectively, and summing the calculated similarity values to calculate a first sum, multiplying each of the similarity values of reference relationships between the subject document and each of the neighbor documents by a corresponding value of reference information of the first reference document for each of the neighbor documents, and summing the multiplied values to calculate a second sum, and evaluating a value of reference information using a ratio of the first and second sums.


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