The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

Feb. 05, 2015
Applicants:

Yoichi Kubota, Tokyo, JP;

Kohei Shimbo, Kanagawa, JP;

Naohiro Kamijo, Kanagawa, JP;

Inventors:

Yoichi Kubota, Tokyo, JP;

Kohei Shimbo, Kanagawa, JP;

Naohiro Kamijo, Kanagawa, JP;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/60 (2006.01); G06K 15/02 (2006.01);
U.S. Cl.
CPC ...
G06K 15/1878 (2013.01); G06K 15/027 (2013.01); H04N 1/6027 (2013.01); H04N 1/6041 (2013.01); H04N 1/6044 (2013.01); H04N 1/6097 (2013.01);
Abstract

A spectral characteristic acquisition device includes a light irradiation part configured to irradiate an object with light, a diffraction part configured to diffract light reflected from the object to provide diffracted light, a light-receiving part configured to receive the diffracted light and output a signal based on an amount of the diffracted light, a calibration color index configured to include a color with a known spectral characteristic, and an operation part configured to calculate a spectral characteristic of the object from a signal output from the light-receiving part by using a predetermined transformation matrix and calibrate the transformation matrix by using the calibration color index.


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