The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

Sep. 18, 2013
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventor:

Christopher Stacey, Opawa, NZ;

Assignee:

EMC CORPORATION, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/3012 (2013.01); G06F 17/30997 (2013.01);
Abstract

Implementations are provided herein relating to augmenting metadata collection within a storage platform. The storage platform can be audited to determine the types of metadata currently being gathered within the storage platform, and the schedule for when that information is gathered. The storage platform can receive a request to generate metadata, compare the requested information with the previously generated and/or scheduled generation of metadata. Rather than redundantly gathering the same metadata via multiple requests, known metadata or scheduled retrieval of known metadata can be used to process portions of the metadata request, and any metadata that was not previously generated can then be separately generated. In this sense, the metadata collection within a storage platform can be augmented to gather additional metadata requested outside the storage platform in an efficient matter that does not unnecessarily increase scanning activity within the storage platform.


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