The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2015
Filed:
Dec. 27, 2012
Dong Ik Kim, Sejong, KR;
Geon Hee Kim, Sejong, KR;
Ghi Seok Kim, Daejeon, KR;
Ki Soo Chang, Daejeon, KR;
Dong Ik Kim, Sejong, KR;
Geon Hee Kim, Sejong, KR;
Ghi Seok Kim, Daejeon, KR;
Ki Soo Chang, Daejeon, KR;
KOREA BASIC SCIENCE INSTITUTE, Daejeon, KR;
Abstract
Surface measurement data just provides the coordinates of an object surface without giving various parameters like the radius of curvature, conic constant, and deformation coefficients. In this paper, we propose a novel method for extracting the important parameters for the determination of unknown aspheric surface equations from the measurement of aspheric surfaces. The largest error between the original surface and the reconstructed surface in the theoretical case is shown to be about 8.6 nm. This fact implies that the new method is well suited for the reconstruction of unknown surface equations.