The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

Apr. 09, 2012
Applicants:

Ethan H. Cannon, Sammamish, WA (US);

Michael J. Hauser, Bolton, VT (US);

Timothy D. Sullivan, Underhill, VT (US);

Inventors:

Ethan H. Cannon, Sammamish, WA (US);

Michael J. Hauser, Bolton, VT (US);

Timothy D. Sullivan, Underhill, VT (US);

Assignee:

GLOBALFOUNDRIES INC., Grand Cayman, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01); G01T 5/02 (2006.01); H01L 23/556 (2006.01); H01L 27/146 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
G01T 5/02 (2013.01); H01L 23/556 (2013.01); H01L 27/14618 (2013.01); H01L 27/14636 (2013.01); H01L 24/16 (2013.01); H01L 2224/16225 (2013.01); H01L 2924/12032 (2013.01); H01L 2924/157 (2013.01); H01L 2924/15331 (2013.01);
Abstract

Systems and methods to ensure correct operation of a semiconductor chip in the presence of ionizing radiation is disclosed. The system includes a semiconductor chip, a first radiation detection array incorporated in the semiconductor chip, and at least one additional radiation detection array incorporated in the semiconductor chip. a processor determines a region of the semiconductor chip affected by an incident radiation particle by analyzing a trajectory of the radiation particle determined from locations of sensors hit by the radiation particle in the first radiation detection array and the at least one additional radiation detection array. The processor determines whether corrective action is needed based on the region of the semiconductor chip affected by the incident radiation particle.


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