The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

Nov. 05, 2013
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Kenichi Shimoyama, Tokyo, JP;

Akihito Seki, Kanagawa, JP;

Satoshi Ito, Kanagawa, JP;

Masaki Yamazaki, Tokyo, JP;

Yuta Itoh, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01S 17/42 (2006.01); G01S 7/481 (2006.01);
U.S. Cl.
CPC ...
G01S 17/42 (2013.01); G01S 7/4817 (2013.01);
Abstract

An example three-dimensional model generating device includes an emitting unit that emits a laser light and a first deflector that deflects laser light, whose emission direction rotates in a first rotation range, within a first scan plane. A second deflector deflects laser light, whose emission direction rotates in a second rotation range, within a second scan plane intersecting with the first scan plane. The detector detects a reflected light when laser light deflected from the first deflector is reflected from the target object or detects a reflected light when laser light deflected from the second deflector is reflected from the target object. The measuring unit measures a distance to the target object on the basis of the time taken since emission of the laser light to detection of the reflected light. The generating unit generates a three-dimensional model of the target object by using the measurement result.


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