The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

Mar. 24, 2011
Applicants:

Hiroo Tatsutani, Kobe, JP;

Hiroyuki Tanaka, Halstenbek, DE;

Inventors:

Hiroo Tatsutani, Kobe, JP;

Hiroyuki Tanaka, Halstenbek, DE;

Assignee:

SYSMEX CORPORATION, Kobe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/02 (2006.01); G01N 35/04 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/04 (2013.01); G01N 35/0092 (2013.01); G01N 35/021 (2013.01); G01N 2035/00752 (2013.01); G01N 2035/0462 (2013.01); G01N 2035/0465 (2013.01); G01N 2035/0467 (2013.01); G01N 2035/0493 (2013.01);
Abstract

A sample processing system comprising: first, second and third sample processing units; first, second and third sample transport units; and a control section is disclosed. In order to transport a sample rack which is to be introduced to the first sample transport unit to a destination sample transport unit which is located downstream of a second sample transport unit, the control section initially controls the first and second transport unit to move a transport member. When the sample rack arrives at a predetermined position on the transport path of the first transport unit, the control section controls the third transport unit to move a transport member.


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