The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

Jan. 11, 2013
Applicant:

Institut Dr. Foerster Gmbh & Co. KG, Reutlingen, DE;

Inventors:

Matthias Boecker, Reutlingen, DE;

Franz Haditsch, Reutlingen, DE;

Stefan Koch, Bisingen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/90 (2006.01);
U.S. Cl.
CPC ...
G01N 27/9033 (2013.01); G01N 27/9026 (2013.01);
Abstract

A feed-through coil arrangement for an apparatus that tests long products via eddy current includes an exciter coil arrangement with an exciter coil having a passage opening for the long product, and a receiver coil arrangement around the opening. The receiver coil arrangement includes two segment coil arrangements distributed over the passage circumference, wherein each segment coil arrangement has a detection range covering only a circumferential section of the long product circumference. The segment coil arrangements are distributed over two shells surrounding the opening at different distances to a reference axis. First segment coil arrangements on a first shell are without reciprocal overlapping and second segment coil arrangements on a second shell are without reciprocal overlapping. The first and second segment coil arrangements are arranged circumferentially offset to one another such that the second segment coil arrangements detect circumferential sections not covered by the first segment coil arrangements.


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