The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2015
Filed:
Jan. 23, 2013
Hitachi-ge Nuclear Energy, Ltd., Hitachi-shi, Ibaraki, JP;
Akira Nishimizu, Tokai, JP;
So Kitazawa, Mito, JP;
Naoyuki Kono, Mito, JP;
Hisashi Endo, Hitachi, JP;
Kenichi Otani, Hitachi, JP;
Taiichiro Yamada, Hitachi, JP;
Hirofumi Ouchi, Mito, JP;
Isao Yoshida, Iwaki, JP;
Yoshio Nonaka, Mito, JP;
Masafumi Imai, Hitachiota, JP;
Hitachi-GE Nuclear Energy, Ltd., Hitachi-shi, JP;
Abstract
An eddy current flaw detection system includes an eddy current flaw detection probe having a substrate facing an inspection surface, and at least one exciting coil and at least two detecting coils provided on the substrate, a scanning device which scans the probe on the inspection surface, a scan control device which drives and controls the scanning device, an eddy current flaw detection device which acquires results of detection of a plurality of detection points corresponding to combinations of the exciting and detecting coils for each scan position of the probe, and a data processing/display device which processes data from the scan control device and the eddy current flaw detection device and thereby displays a result of flaw detection. The data processing/display device acquires three-dimensional coordinates of the detection points for each scan position of the probe and thereby creates three-dimensional flaw detection data.