The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2015
Filed:
Mar. 28, 2014
Applicant:
Morpho Detection, Llc, Newark, CA (US);
Inventor:
Geoffrey Harding, Hamburg, DE;
Assignee:
MORPHO DETECTION, LLC, Newark, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2006.01); G21K 1/02 (2006.01);
U.S. Cl.
CPC ...
G01N 23/20008 (2013.01); G21K 1/02 (2013.01); G21K 2201/067 (2013.01);
Abstract
An x-ray diffraction imaging (XDI) system includes a plurality of x-ray sources configured to generate x-rays directed toward an object. The XDI system also includes a primary collimator positioned a distance from the plurality of x-ray sources. A plurality of nodes are defined within the primary collimator at a plurality of node distances from the plurality of x-ray sources. Each node of the plurality of nodes defines an x-ray intersection region. The XDI system further includes a supermirror assembly including a plurality of mounting rails positioned adjacent the plurality of nodes.