The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2015
Filed:
May. 09, 2014
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Jun Hirabayashi, Yokohama, JP;
Takamasa Seto, Ebina, JP;
Assignee:
CANON KABUSHIKI KAISHA, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01); G01N 21/57 (2006.01); H04N 1/56 (2006.01); G06T 15/50 (2011.01); H04N 1/401 (2006.01); G01N 21/3563 (2014.01);
U.S. Cl.
CPC ...
G01N 21/57 (2013.01); G06F 3/1211 (2013.01); G06F 3/1237 (2013.01); G06T 15/506 (2013.01); H04N 1/401 (2013.01); H04N 1/56 (2013.01); G01N 21/3563 (2013.01); G06T 2200/08 (2013.01);
Abstract
A measurement apparatus comprises a light source of line shape configured to move in a predetermined direction and illuminate a measurement target object, and a capturing unit configured to capture the measurement target object illuminated by the light source of line shape. The measurement apparatus controls the light source of line shape and the capturing unit, and estimates the reflection characteristics of the measurement target object from a plurality of images captured by the capturing unit.