The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2015
Filed:
Dec. 18, 2013
Applicant:
Nexus Dx, Inc., San Diego, CA (US);
Inventors:
Richard Egan, Oceanside, CA (US);
Graham Lidgard, La Jolla, CA (US);
David Booker, Oceanside, CA (US);
Assignee:
Nexus Dx, Inc., San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/01 (2006.01); G01N 21/55 (2014.01); G01N 21/84 (2006.01); G01N 33/487 (2006.01); G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
G01N 21/01 (2013.01); G01N 21/84 (2013.01); G01N 21/8483 (2013.01); G01N 33/487 (2013.01); G01N 2201/0446 (2013.01); G01N 2201/126 (2013.01); G06F 19/366 (2013.01);
Abstract
A diagnostic assay system including a test device and a scanning device are described. In one implementation, the scanning device includes a source of electromagnetic radiation, an optics assembly, a detector, and a microprocessor disposed within a chassis. The test device and scanning device may be configured to be movable relative to each other during operation of the scanning device.