The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

Feb. 27, 2013
Applicant:

Regents of the University of Minnesota, Minneapolis, MN (US);

Inventors:

Jing Wang, Zurich, CH;

David Y. H. Pui, Plymouth, MN (US);

Heinz Fissan, Kerken, DE;

Sheng-Chieh Chen, St. Paul, MN (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/00 (2006.01); G01N 1/28 (2006.01); G01N 15/02 (2006.01); G01N 15/06 (2006.01);
U.S. Cl.
CPC ...
G01N 1/28 (2013.01); G01N 15/0272 (2013.01); G01N 15/06 (2013.01); G01N 2015/0065 (2013.01);
Abstract

A system and method for characterizing a totality of particles selects a class of the totality of particles having a defined mobility; determines the total particle concentration of the class of particles; filters the class of particles using the filter apparatus and determines a filtered particle concentration indicative of the particles of the class which penetrate the filter apparatus; and determines at least one morphological parameter based on the fraction of particles of a class penetrating the filter apparatus.


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