The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2015
Filed:
Sep. 26, 2008
Applicant:
Kotaro Yasuda, Minami-ashigara, JP;
Inventor:
Kotaro Yasuda, Minami-ashigara, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/1335 (2006.01); C09K 19/04 (2006.01); G02F 1/13363 (2006.01); G02F 1/1343 (2006.01);
U.S. Cl.
CPC ...
C09K 19/04 (2013.01); G02F 1/13363 (2013.01); G02F 1/133528 (2013.01); G02F 1/134363 (2013.01); G02F 2001/133637 (2013.01); G02F 2202/40 (2013.01); G02F 2203/60 (2013.01);
Abstract
Disclosed is a liquid-crystal display device comprising a polarizing plate comprising a polarizing element and a thermoplastic-resin film which comprises a lactone ring-having polymer and satisfies the following formulas (I) and (II): (I) 0=|Re(630)|=10, and |Rth(630)|=25 (II) |Re(400)−Re(700)|=10, and |Rth(400)−Rth(700)|=35 wherein Re(?) means retardation (nm) in plane at a wavelength ? nm; and Re(?) means retardation (nm) along the thickness direction at a wavelength ? nm.