The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2015
Filed:
Oct. 17, 2012
Thomas Bernard, Karlsruhe, DE;
Harald Hain, Kahl, DE;
Thomas Bogdahn, Karlstein, DE;
Oliver Ganz, Bruchköbel, DE;
Thomas Bernard, Karlsruhe, DE;
Harald Hain, Kahl, DE;
Thomas Bogdahn, Karlstein, DE;
Oliver Ganz, Bruchköbel, DE;
Heraeus Quarzglas GmbH & Co. KG, Hanau, DE;
Fraunhofer Gesellschaft zur Förderung der angewandten Forschung e.V., Munich, DE;
Abstract
A method for using a temperature control loop in order to further develop process control during elongation of a cylindrical preform such that a component strand with high dimensional accuracy can be drawn even in the presence of temperature-effective defects during the elongation process: (a) the continuous measurement of a first temperature value, T, at an upper measuring point on the surface of the cylindrical preform; (b) the continuous measurement of a second temperature value, T, at a lower measuring point; (c) calculation of a temperature distribution in the region between the measuring points Tand T, and determination of a modelled deformation temperature, T, using an algorithmic model taking with first and the second temperature values as model input parameters, and the modelled deformation temperature, T, as a regulating variable and the heating-zone temperature Tas a manipulated variable for the temperature-control loop.