The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

Feb. 28, 2012
Applicants:

Peter Carlo Rem, Rijswijk, NL;

Martinus Cornelis Maria Bakker, Delfgauw, NL;

Simon Peter Maria Berkhout, Delft, NL;

Mohammed Abdur Rahman, Delft, NL;

Inventors:
Assignee:

Inashco R&D B.V., Delft, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B03C 1/24 (2006.01); B03C 1/30 (2006.01); B03C 1/247 (2006.01);
U.S. Cl.
CPC ...
B03C 1/30 (2013.01); B03C 1/247 (2013.01); B03C 2201/20 (2013.01); B03C 2201/24 (2013.01);
Abstract

Eddy current separation apparatus for separating particles from a particle stream. The eddy current separation apparatus comprises a separator drum adapted to create a first particle fraction and a second particle fraction, a feeding device upstream of the separator drum for supplying particles to the separator drum, and a splitter element provided downstream of the separator drum for splitting the respective fractions. The eddy current separation apparatus further comprises a sensor device arranged for detecting particles, and counting and/or detecting material properties of the detected particles, from at least part of one of the particle fractions. The eddy current separation apparatus is configured to adjust, in use, a position and/or orientation of the splitter element with respect to the separator drum and/or a transporting velocity of the feeding device in dependence of a signal from the sensor device based on a counted number and/or material properties of the detected particles.


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