The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2015
Filed:
Sep. 06, 2012
Ran Yam, Jerusalem, IL;
Aderet Sompolinsky, Jerusalem, IL;
Ian Melnick, Jerusalem, IL;
Visionix Ltd., Jerusalem, IL;
Abstract
Systems for performing sequential multiple function ophthalmic measurements using separate measurement instruments, by mechanical switching between the instruments. In prior art systems, the separate measurement instruments are stacked, and transfer between them is performed by means of a linear mechanical motion stage. The separate measurement instruments of the present application are mounted on a base which is rotatably pivoted around a joint at a location remote from the optical entry apertures of the instruments. The entrance apertures of the measurement instruments then traverse the eye being measured sequentially. A rotational motion around the pivoted joint is thus transformed into a linear motion at the eye of the subject, without the need for a linear motion stage. A Scheimpflug camera corneal thickness measurement is also described, in which the measurement head is tilted during the corneal scan such that the illuminating slit beam always impinges on the cornea normally.