The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2015

Filed:

Oct. 03, 2013
Applicant:

California Institute of Technology, Pasadena, CA (US);

Inventors:

Morteza Gharib, Altadena, CA (US);

Emilio Graff, Pasadena, CA (US);

Francisco Pereira, Rome, IT;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G01B 11/24 (2006.01); G01B 11/25 (2006.01); H04N 5/335 (2011.01);
U.S. Cl.
CPC ...
H04N 13/0203 (2013.01); G01B 11/24 (2013.01); G01B 11/2509 (2013.01); H04N 5/335 (2013.01);
Abstract

Described is a method and apparatus for obtaining additional information from an object and a method for surface imaging and three-dimensional imaging. Single lens, single aperture, single sensor system and stereo optic systems may be modified in order to successfully generate surface maps of objects or three-dimensional representations of target objects. A variety of the aspects of the present invention provide examples of the use of an addressable pattern in order to overcome mismatching common to standard defocusing techniques.


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