The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2015
Filed:
Aug. 22, 2012
Tariq Manzur, Lincoln, RI (US);
John W. Zeller, Middletown, CT (US);
Tariq Manzur, Lincoln, RI (US);
John W. Zeller, Middletown, CT (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
An image analysis system and method are provided. The system can include a base for receiving an optical surface, at least one light source positioned above and at an oblique angle with respect to the optical surface, a camera positioned above the optical surface and adapted to provide an image data indicative of an image of the optical surface, and a computerized system adapted to receive the image data from the camera. The computerized system can analyze the image data to identify and quantify surface defects. Classification identifiers can be assigned to each surface defect based on the physical characteristics of the surface defect. A transmission metric is calculated for the optical surface to allow objective judgment of the surface.