The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2015
Filed:
Aug. 23, 2012
Kexiang Ken Ding, San Diego, CA (US);
Michael Anthony Laver, El Cajon, CA (US);
James Frandsen, Ramona, CA (US);
Samer Kabbani, Carlsbad, CA (US);
Kexiang Ken Ding, San Diego, CA (US);
Michael Anthony Laver, El Cajon, CA (US);
James Frandsen, Ramona, CA (US);
Samer Kabbani, Carlsbad, CA (US);
Delta Design, Inc., Poway, CA (US);
Abstract
A system for detecting characteristics of a surface includes multiple sources of lights, a platform structure configured to support the surface, a lens aligned with the platform structure, a cropping aperture, and an image receiver. The platform structure is configured to receive light from the source of light and the lens is positioned such that the source of light is not in focus, but the detected surface is in focus. The cropping aperture is configured to crop light reflected from the surface, and the image receiver is configured to receive the light conditioned by the cropping aperture.