The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2015

Filed:

Sep. 19, 2013
Applicant:

Fuji Xerox Co., Ltd., Tokyo, JP;

Inventors:

Takashi Hiramatsu, Ashigarakami-gun, JP;

Kiyofumi Aikawa, Ashigarakami-gun, JP;

Michio Kikuchi, Ashigarakami-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01); B41J 29/46 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00005 (2013.01); B41J 29/46 (2013.01); H04N 1/0005 (2013.01); H04N 1/00015 (2013.01); H04N 1/00042 (2013.01); H04N 1/00076 (2013.01); H04N 1/00092 (2013.01); G01N 2021/8864 (2013.01);
Abstract

There is provided an image inspection system. An image reading unit reads a formed image which is formed on a recording medium based on original image data to generate read image data. A determination unit compares the read image data and the original image data to determine whether or not the formed image includes a defective region. An extraction unit extracts an image of characters present around the defective region from the read image data. An image display device displays the image of the characters and an image of the defective region such that both the images overlap with each other.


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