The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2015
Filed:
Apr. 08, 2014
Cellco Partnership, Basking Ridge, NJ (US);
Ye Ouyang, Basking Ridge, NJ (US);
Carol Becht, Boonton, NJ (US);
Gopinath Venkatasubramaniam, Bridgewater, NJ (US);
Christopher M. Schmidt, Branchburg, NJ (US);
Cellco Partnership, Basking Ridge, NJ (US);
Abstract
Systems and methods for evaluating device quality are disclosed. Some implementations include receiving, operational parameters for a mobile device, where the operational parameters include data related to service disturbances in a plurality of areas of operational performance of the mobile device, computing, for each dimension of a plurality of dimensions, a curve indicative of a relationship between a device quality index (DQI) and operational parameters of the mobile device, where each dimension corresponds to a particular area of operational performance of the mobile device, identifying cliff points in each dimension of a multi-dimensional surface fitted to each computed curve, where each cliff point corresponds to a reduction in a user's quality of experience in a particular area of operational performance, and projecting the identified cliff points in each dimension of the multi-dimensional surface to determine a horizontal space in the multi-dimensional surface corresponding to a region of acceptable DQIs.