The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2015
Filed:
Sep. 21, 2010
Haotian Zhang, Longmont, CO (US);
Hongwei Song, Longmont, CO (US);
Jingfeng Liu, Longmont, CO (US);
Yu Liao, Longmont, CO (US);
Haotian Zhang, Longmont, CO (US);
Hongwei Song, Longmont, CO (US);
Jingfeng Liu, Longmont, CO (US);
Yu Liao, Longmont, CO (US);
Avago Technologies General IP (Singapore) Pte. Ltd., Singapore, SG;
Abstract
Various embodiments of the present invention provide systems and methods for calibrating a data processing circuit. For example, a method for calibrating a data processing circuit is discussed that includes providing a digital filter, providing a detector circuit, and providing an analog filter. Operation of the digital filter is at least in part governed by filter taps that correspond to a filter tap constraint value. Operation of the detector circuit is at least in part governed by a target parameter. Operation of the analog filter is at least in part governed by an analog parameter that is one of a plurality of analog parameters. The methods further include selecting a target parameter, and calculating the filter tap constraint value based on the target parameter. Combinations of the target parameter, the calculated filter tap constraint value, and each of the plurality of analog parameters are applied to identify the analog parameter.