The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2015

Filed:

Sep. 21, 2011
Applicants:

Daisuke Endo, Kyoto, JP;

Yoshihiro Katayama, Kyoto, JP;

Inventors:

Daisuke Endo, Kyoto, JP;

Yoshihiro Katayama, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01M 4/131 (2010.01); H01M 4/505 (2010.01); H01M 4/525 (2010.01); H01M 10/0525 (2010.01);
U.S. Cl.
CPC ...
H01M 4/131 (2013.01); H01M 4/505 (2013.01); H01M 4/525 (2013.01); H01M 10/0525 (2013.01); Y02E 60/122 (2013.01); Y02T 10/7011 (2013.01);
Abstract

[Object]; There is provided an active material for a lithium secondary battery, which has a high initial efficiency and a high discharge capacity, and particularly has a high discharge capacity at a low temperature (excellent low-temperature characteristic), and a lithium secondary battery using the active material. [Solution]; An active material for a lithium secondary battery, which contains a solid solution of a lithium transition metal composite oxide having an α-NaFeOcrystal structure, wherein the composition ratio of metal elements contained in the solid solution satisfies, LiNaCoNiMnO(0<y≦0.1, 0.4≦c≦0.7, x+a+b+c=1, 0.1≦x≦0.25, −0.2≦d≦0.2), the active material has an X-ray diffraction pattern attributable to a space group R3-m (P312), and in the Miller index hkl, the half width of the diffraction peak of the (003) is 0.30° or less and the half width of the diffraction peak of the (114) plane is 0.50° or less. Further, the average of three oxygen position parameters determined from crystal structure analysis by the Rietveld method on the basis of the X-ray diffraction pattern is preferably 0.264 or less.


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