The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9218847 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 22, 2015

Filed:

Dec. 18, 2013
Applicant:

Hgst Netherlands B.v., Amsterdam, NL;

Inventors:

Weldon Mark Hanson, Rochester, MN (US);

Michael Paul Salo, San Jose, CA (US);

Alexander Taratorin, Sunnyvale, CA (US);

Roger William Wood, Gilroy, CA (US);

Assignee:

HGST NETHERLANDS B.V., Amsterdam, NL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11B 20/18 (2006.01); G11B 20/10 (2006.01);
U.S. Cl.
CPC ...
G11B 20/182 (2013.01); G11B 20/10398 (2013.01);
Abstract

A method of testing a one or more components of a data storage system introduces a first plurality of micro-transitions into a first data write pattern, which is then written to a magnetic media. A read-back signal is generated, and a frequency response of the read-back signal is analyzed to determine performance of the one or more components of the data storage system.


Find Patent Forward Citations

Hanson, Weldon. (2015). System and method for testing data storage systems utilizing micro-transitions (U.S. Patent No. 9218847). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9218847

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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