The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2015

Filed:

Dec. 07, 2012
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Patrick S. Piemonte, San Francisco, CA (US);

Billy P. Chen, Santa Clara, CA (US);

Christopher Blumenberg, San Francisco, CA (US);

Edward Kandrot, San Jose, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); G06K 9/40 (2006.01); G06T 15/50 (2011.01); G06T 19/20 (2011.01); G01C 21/36 (2006.01);
U.S. Cl.
CPC ...
G06T 15/00 (2013.01); G01C 21/3638 (2013.01); G01C 21/3682 (2013.01); G06T 15/503 (2013.01); G06T 19/20 (2013.01); G06T 2210/62 (2013.01); G06T 2219/2012 (2013.01);
Abstract

Systems and methods for rendering 3D maps may highlight a feature in a 3D map while preserving depth. A map tool of a mapping or navigation application that detects the selection of a feature in a 3D map (e.g., by touch) may perform a ray intersection to determine the feature that was selected. The map tool may capture the frame to be displayed (with the selected feature highlighted) in several steps. Each step may translate the map about a pivot point of the selected map feature (e.g., in three or four directions) to capture a new frame. The captured frames may be blended together to create a blurred map view that depicts 3D depth in the scene. A crisp version of the selected feature may then be rendered within the otherwise blurred 3D map. Color, brightness, contrast, or saturation values may be modified to further highlight the selected feature.


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