The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2015
Filed:
Feb. 07, 2013
International Business Machines Corporation, Armonk, NY (US);
Carl Engel, Pendergrass, GA (US);
Wesley M. Gifford, New Canaan, CT (US);
Craig A. Rahenkamp, Niwot, CO (US);
Krishna Ratakonda, Yorktown Heights, NY (US);
Nianjun Zhou, Danbury, CT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Techniques for quantifying the quality of trend lines. A method includes defining a collection of reference data sets derived from multiple historical projects in a similar subject area as the target project, defining one or more indicators of data set applicability to a target project estimation, said defining based on multiple characteristics of the target project, evaluating applicability of each of the reference data sets based on the one or more indicators, and identifying one or more of the reference data sets as applicable for use in the target project estimation.