The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2015

Filed:

Apr. 15, 2013
Applicant:

Lewis Innovative Technologies, Inc., Decatur, AL (US);

Inventors:

James M Lewis, Moulton, AL (US);

Dane R Walther, Madison, AL (US);

Paul H Horn, Huntsville, AL (US);

Assignee:

LEWIS INNOVATIVE TECHNOLOGIES, Decatur, AL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/44 (2013.01); G06F 21/70 (2013.01); G06F 21/73 (2013.01); G09C 1/00 (2006.01); H04L 9/08 (2006.01);
U.S. Cl.
CPC ...
G06F 21/44 (2013.01); G06F 21/70 (2013.01); G06F 21/73 (2013.01); G09C 1/00 (2013.01); H04L 9/0866 (2013.01); H04L 2209/12 (2013.01);
Abstract

An electronic asymmetric unclonable function applied to an electronic system being evaluated includes an electronic system and an AUF array electronically associated with the electronic system. The AUF array includes a plurality of non-identical cells. Each of the non-identical cells includes a test element representing a characteristic of the electronic system being evaluated and a measurement device evaluating the test element. A comparison unit processes an output of the measurement device to provide a multi-bit output value representing a magnitude of differences.


Find Patent Forward Citations

Loading…