The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2015
Filed:
Sep. 25, 2013
Applicant:
Lexmark International, Inc., Lexington, KY (US);
Inventors:
Christopher Alan Adkins, Lexington, KY (US);
Mark Leo Doerre, Lexington, KY (US);
Assignee:
LEXMARK INTERNATIONAL, INC., Lexington, KY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 21/60 (2013.01); G06F 21/62 (2013.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 21/606 (2013.01); G06F 21/608 (2013.01); G06F 21/6209 (2013.01); G06F 2221/2101 (2013.01);
Abstract
The invention is directed to a method for performing failure analysis on an imaging device that includes retrieving an encrypted error log containing one or more error conditions that occurred on the imaging device, decrypting the retrieved encrypted error log, determining if the retrieved encrypted error log has been altered based on the decrypted error log, and upon determining that the retrieved encrypted error log has not been altered, performing failure analysis on the imaging device using the decrypted error log.