The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2015

Filed:

Dec. 22, 2014
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Masayasu Teramura, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 15/14 (2006.01); B41J 2/385 (2006.01); G02B 26/12 (2006.01); G03G 15/043 (2006.01);
U.S. Cl.
CPC ...
G02B 26/124 (2013.01); G02B 26/123 (2013.01); G03G 15/043 (2013.01);
Abstract

A scanning optical system includes a light source including light emission points, a deflector for deflecting a beam in main scanning direction, an optical element for guiding the beam from the light source to the deflector, and a stop for limiting the beam from the optical element, sets the followings appropriately: distance from the light source to the stop; focal length of the optical element; distance in main scanning direction from an intersection of optical axis and the light source at a farthest light emission point from the optical axis in main scanning direction; stop aperture diameter in main scanning direction; total angle at half maximum of a far-field pattern of emitted light; and angle between a marginal ray within main scanning section at the farthest light emission point from the optical axis in main scanning direction and a ray of a maximum intensity.


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