The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2015
Filed:
Oct. 30, 2009
Applicants:
Masaharu Shibata, Kobe, JP;
Daigo Fukuma, Kobe, JP;
Takaaki Nagai, Kobe, JP;
Inventors:
Assignee:
SYSMEX CORPORATION, Hyogo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B08B 9/027 (2006.01); G01N 33/00 (2006.01); G01N 33/48 (2006.01); G01N 21/00 (2006.01); G01N 35/10 (2006.01); B01L 3/02 (2006.01); G01N 35/00 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/1004 (2013.01); B01L 3/0293 (2013.01); G01N 35/00712 (2013.01); G01N 35/0095 (2013.01); G01N 35/00594 (2013.01); G01N 2035/0415 (2013.01); G01N 2035/1032 (2013.01);
Abstract
The present invention is to present a sample processing apparatus, comprising: a sample processing mechanism which comprises a flow channel to be used for processing a sample, and performs a sample processing operation for processing the sample using the flow channel and a cleaning operation for cleaning the flow channel; and a controller for controlling the cleaning operation by the sample processing mechanism, based on an elapsed time since a previous cleaning operation by the sample processing mechanism.