The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2015

Filed:

Mar. 02, 2012
Applicants:

Scott Sloss, Inverness, GB;

Russell Bain, Inverness, GB;

Graeme Webster, Inverness, GB;

Inventors:

Scott Sloss, Inverness, GB;

Russell Bain, Inverness, GB;

Graeme Webster, Inverness, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/327 (2006.01);
U.S. Cl.
CPC ...
G01N 27/3272 (2013.01);
Abstract

An analytical test strip ('ATT') for use with a test meter includes a first insulating layer, with a first insulating layer upper surface, and a first electrically conductive layer ('ECL') disposed thereon. The first ECL includes a first electrode portion (“EP”) and an electrical contact pad in electrical communication with the first EP. The ATT also includes a patterned spacer layer disposed above the first ECL that includes (i) a distal portion defining a bodily fluid sample-receiving chamber therein that overlies the first EP and (ii) an insulating proximal portion with an upper surface having a second ECL disposed thereon. The second ECL includes an interlayer contact portion and an electrical contact pad. A third ECL of the ATT includes a second EP and a proximal portion that overlies the interlayer contact portion. The second EP is disposed overlying and exposed to the sample-receiving chamber in an opposing relationship to the first EP.


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