The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2015

Filed:

Mar. 28, 2014
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Wataru Kitamura, Matsudo, JP;

Ryoichi Tokimitsu, Kashiwa, JP;

Masaki Nonaka, Toride, JP;

Mai Murakami, Kashiwa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/95 (2006.01); G03G 5/05 (2006.01); G03G 5/06 (2006.01); G03G 5/10 (2006.01); G03G 5/14 (2006.01);
U.S. Cl.
CPC ...
G01N 21/95 (2013.01); G03G 5/0525 (2013.01); G03G 5/0696 (2013.01); G03G 5/102 (2013.01); G03G 5/144 (2013.01);
Abstract

A method is provided for testing a charge generation layer disposed directly on an undercoat layer disposed directly on an aluminum-based cylindrical support member formed by extrusion and drawing having a periphery not subjected to cutting work. The method includes testing the charge generation layer for a defect or a suspected defect by irradiating the charge generation layer with light, and receiving reflected light from the charge generation layer with a light receiving device. The light emitted to the charge generation layer has a wavelength within the range of the absorption wavelengths of the charge generation layer, and whose transmittance to the undercoat layer is 0.3% or less.


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