The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2015

Filed:

Mar. 31, 2012
Applicant:

Daniel Orband, Boxford, MA (US);

Inventor:

Daniel Orband, Boxford, MA (US);

Assignee:

OPTIKOS CORPORATION, Wakefield, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01M 11/02 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0207 (2013.01); G01M 11/0292 (2013.01); G01N 21/35 (2013.01);
Abstract

A system for quickly measuring and displaying in real-time a variety of performance characteristics of IR optical components such as lenses, or the like. The system is video based and is under the control of a computer which uses a windowing software program to provide the user with a graphical user interface by which the various components of the system and test lenses may be characterized and operated on through functions available via the interface. The system has features for compensating for the presence of IR background radiation that may be present during a measurement cycle and for drift in the video imager. Thermal management features are included to minimize IR background.


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