The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2015
Filed:
Jun. 17, 2014
Electronics and Telecommunications Research Institute, Daejeon, KR;
Nac Woo Kim, Seoul, KR;
Byung Tak Lee, Suwon-si, KR;
Mun Seob Lee, Daejeon, KR;
Sim Kwon Yoon, Gwangju, KR;
Young Sun Kim, Gwangju, KR;
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE, Daejeon, KR;
Abstract
Provided are an apparatus and method for recognizing an object on the basis of property information on an object obtained using a multi-wavelength spectrometer. An apparatus for recognizing an object using a multi-wavelength spectrometer includes an image processing unit configured to extract an region of interest from an input three-dimensional image and output shape information on the region of interest, a light irradiation unit configured to irradiate light of a plurality of wavelengths to an arbitrary position of an object corresponding to the detected region of interest, a light receiving unit configured to measure a spectrophotometric value for each light of the plurality of wavelengths, and a light processing unit configured to generate a differential spectrophotometric map using a differential value between spectrophotometric values of different wavelengths measured at the same light irradiation position, and recognize the object using the differential spectrophotometric map and the shape information.