The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2015
Filed:
Mar. 11, 2013
Bausch & Lomb Incorporated, Rochester, NY (US);
Technolas Perfect Vision Gmbh, Munich, DE;
David Haydn Mordaunt, Los Gatos, CA (US);
Holger Schlueter, Munich, DE;
Frieder Loesel, Mannheim, DE;
BAUSCH & LOMB INCORPORATED, Rochester, NY (US);
TECHNOLAS PERFECT VISION GMBH, Munich, DE;
Abstract
A system and method for creating a line recognition template that replicates an object is provided for use as a control reference during ophthalmic surgery on the object. Creation of the template first requires aligning a plurality of reference points along a central 'z' axis, with anatomically measured lengths (Δ'z') between adjacent reference points. Axially-symmetric surfaces can then be traced between selected, adjacent, reference points to create the template. For the present invention, the location of reference points, and the tracing of axially-symmetric surfaces, are based on a cross sectional image of the object for surgery. Preferably, the cross sectional image is obtained using Optical Coherence Tomography (OCT) techniques.