The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2015
Filed:
Apr. 19, 2010
Applicant:
Kwang Hee Lee, Seoul, KR;
Inventor:
Kwang Hee Lee, Seoul, KR;
Assignee:
SAMSUNG MEDISON CO., LTD., Hongcheon-Gun, Gangwon-Do, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); A61B 8/08 (2006.01);
U.S. Cl.
CPC ...
A61B 8/0858 (2013.01); A61B 8/467 (2013.01); A61B 8/483 (2013.01); A61B 8/523 (2013.01); A61B 8/469 (2013.01);
Abstract
Embodiments for providing a plurality of slice images are disclosed. In one embodiment, by way of non-limiting example, an ultrasound system comprises: an ultrasound data acquisition unit configured to transmit and receive ultrasound signals to and from a target object to thereby output ultrasound data; and a processing unit configured to form volume data based on the ultrasound data, set a reference slice, a reference point and a window on the volume data based on input information of a user and set a sagittal view for measuring a thickness of a nuchal translucency (NT) of a fetus on the volume data.