The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Jul. 18, 2011
Adriano Macchia, Munich, DE;
Volker Uffenkamp, Ludwigsburg, DE;
Adriano Macchia, Munich, DE;
Volker Uffenkamp, Ludwigsburg, DE;
Robert Bosch GmbH, Stuttgart, DE;
Abstract
The invention relates to a method for calibrating a measurement system having at least one image recording apparatus () having at least two measurement cameras () that form a stereo camera system, and having an analysis unit (), wherein the measurement system is calibrated by means of a calibration device () having reference features (). The process flow of the method is divided into three steps, wherein in a first step the 3D coordinates of the reference features () are determined in a measurement space () of the calibration device () by at least one image recording camera (), and in a second step at least one of the image recording apparatuses () is disposed in the measurement space () of the calibration device (), and in a third step the 3D coordinates of the at least one image recording apparatus () and/or of the at least two measurement cameras () are determined in a common 3D coordinate system by means of the analysis unit () using the 3D coordinates determined in the first step. The calibration device () comprises a measurement space () for receiving the image recording apparatus () and said measurement space is at least partially bounded by a measurement frame () having the reference features ().